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<title><![CDATA[Comentarios al libro: DESIGN, ANALYSIS AND TEST OF LOGIC CIRCUITS UNDER UNCERTAINTY]]></title>
<link><![CDATA[https://bbltk.com/biblioeteca.web/titulo/design%2C-analysis-and-test-of-logic-circuits-under-uncertainty]]></link>
<description><![CDATA[Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.]]></description>
<lastBuildDate>Sun, 19 Apr 2026 21:51:03 +0000</lastBuildDate>
<language>es</language>
<copyright>Copyright 2021 BiblioEteca Technologies SL</copyright>

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